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Abstract Despite remarkable progress in the development of halide perovskite materials and devices, their integration into nanoscale optoelectronics has been hindered by a lack of control over nanoscale patterning. Owing to their tendency to degrade rapidly, perovskites suffer from chemical incompatibility with conventional lithographic processes. Here, we present an alternative, bottom-up approach for precise and scalable formation of perovskite nanocrystal arrays with deterministic control over size, number, and position. In our approach, localized growth and positioning is guided using topographical templates of controlled surface wettability through which nanoscale forces are engineered to achieve sub-lithographic resolutions. With this technique, we demonstrate deterministic arrays of CsPbBr3nanocrystals with tunable dimensions down to <50 nm and positional accuracy <50 nm. Versatile, scalable, and compatible with device integration processes, we then use our technique to demonstrate arrays of nanoscale light-emitting diodes, highlighting the new opportunities that this platform offers for perovskites’ integration into on-chip nanodevices.more » « less
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Mohammadi, Erfan; Kafle, Prapti; Huang, Kai-Yu; Zhu, Weikun; Huang, Jennifer; Jung, Seok-Heon; Lee, Jin-Kyun; Evans, Christopher M.; Diao, Ying (, ACS Applied Materials & Interfaces)
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Zhu, Weikun; Mohammadi, Erfan; Diao, Ying (, Journal of Polymer Science Part B: Polymer Physics)ABSTRACT Morphology modulation offers significant control over organic electronic device performance. However, morphology quantification has been rarely carried outviaimage analysis. In this work, we designed a MATLAB program to evaluate two key parameters describing morphology of small molecule semiconductor thin films: fractal dimension and film coverage. We then use this program in a case study of meniscus‐guided coating of 2,7‐dioctyl[1]benzothieno[3,2‐b][1]benzothiophene (C8‐BTBT) under various conditions to analyze a diverse and complex morphology set. The evolution of morphology in terms of fractal dimension and film coverage was studied as a function of coating speed. We discovered that combined fractal dimension and film coverage can quantitatively capture the key characteristics of C8‐BTBT thin film morphology; change of these two parameters further inform morphology transition. Furthermore, fractal dimension could potentially shed light on thin film growth mechanisms. © 2019 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys.2019, 57, 1622–1634more » « less
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